Home » Nanometer Technology Designs: High-Quality Delay Tests by Mohammad Tehranipoor
Nanometer Technology Designs: High-Quality Delay Tests Mohammad Tehranipoor

Nanometer Technology Designs: High-Quality Delay Tests

Mohammad Tehranipoor

Published December 14th 2011
ISBN : 9781441945594
Paperback
281 pages
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 About the Book 

Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of testMoreTraditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.